Title

Two-step etch in n-on-p type-II superlattices for surface leakage reduction in mid-wave infrared megapixel detectors

Journal title

Opto-Electronics Review

Yearbook

2023

Volume

31

Issue

special issue

Affiliation

Ramos, David : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Ramos, David :  School of Electrical Engineering and Computer Science KTH Royal Institute of Technology, Isafjordsgatan 22, Kista 164 40, Sweden ; Delmas, Marie : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Ivanov, Ruslan : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Žurauskaitė, Laura : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Evans, Dean : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Almqvist, Susanne : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Becanovic, Smilja : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Hellström, Per-Erik :  School of Electrical Engineering and Computer Science KTH Royal Institute of Technology, Isafjordsgatan 22, Kista 164 40, Sweden ; Costard, Eric : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Höglund, Linda : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden

Authors

Ramos, David ; Delmas, Marie ; Ivanov, Ruslan ; Žurauskaitė, Laura ; Evans, Dean ; Almqvist, Susanne ; Becanovic, Smilja ; Hellström, Per-Erik ; Costard, Eric ; Höglund, Linda

Keywords

infrared detector ; surface leakage ; type-II superlattice ; megapixel; n-on-p

Divisions of PAS

Nauki Techniczne

Coverage

e144556

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

24.02.2023

Type

Article

Identifier

DOI: 10.24425/opelre.2023.144556