Details

Title

Advanced Real-time Evaluation and Data Quality Monitoring Model Integration with FPGAs for Tokamak High-performance Soft X-ray Diagnostic System

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2018

Volume

vol. 64

Issue

No 4

Authors

Keywords

data quality monitoring ; system modeling ; FPGA ; Verilog/VHDL ; HDL ; GEM detector ; SXR plasma diagnostics ; modular measurement system ; data evaluation

Divisions of PAS

Nauki Techniczne

Coverage

473-479

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

2018.11.15

Type

Artykuły / Articles

Identifier

DOI: 10.24425/123548 ; eISSN 2300-1933 (since 2013) ; ISSN 2081-8491 (until 2012)

Source

International Journal of Electronics and Telecommunications; 2018; vol. 64; No 4; 473-479

Open Access Policy

International Journal of Electronics and Telecommunications is an open access journal with all content available with no charge in full text version.


The journal content is available under the Creative Commons Attribution 4.0 International License (CC BY 4.0) https://creativecommons.org/licenses/by/4.0/.


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