Details

Title

Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip

Journal title

Metrology and Measurement Systems

Yearbook

2016

Volume

vol. 23

Issue

No 2

Authors

Keywords

analog circuits ; fault diagnosis ; short spot defects ; thermal effects

Divisions of PAS

Nauki Techniczne

Coverage

239-250

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2016.06.30

Type

Artykuły / Articles

Identifier

DOI: 10.1515/mms-2016-0023 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2016; vol. 23; No 2; 239-250

References

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