TY - JOUR N2 - The paper deals with the problem of bias randomization in evaluation of the measuring instrument capability. The bias plays a significant role in assessment of the measuring instrument quality. Because the measurement uncertainty is a comfortable parameter for evaluation in metrology, the bias may be treated as a component of the uncertainty associated with the measuring instrument. The basic method for calculation of the uncertainty in modern metrology is propagation of distributions. Any component of the uncertainty budget should be expressed as a distribution. Usually, in the case of a systematic effect being a bias, the rectangular distribution is assumed. In the paper an alternative randomization method using the Flatten-Gaussian distribution is proposed. L1 - http://www.czasopisma.pan.pl/Content/90359/mainfile.pdf L2 - http://www.czasopisma.pan.pl/Content/90359 PY - 2015 IS - No 4 EP - 520 KW - measurement uncertainty KW - bias randomization KW - measuring instrument capability A1 - Fotowicz, Paweł PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 22 DA - 2015[2015.01.01 AD - 2015.12.31 AD] T1 - Application Of Bias Randomization In Evaluation Of Measuring Instrument Capability SP - 513 UR - http://www.czasopisma.pan.pl/dlibra/publication/edition/90359 T2 - Metrology and Measurement Systems ER -