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Bulletin of the Polish Academy of Sciences Technical Sciences (1)
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A few-shot fine-grained image recognition method
Jianwei Wang
Deyun Chen
Bulletin of the Polish Academy of Sciences Technical Sciences | 2023 | 71 | 1
| e144584 | DOI:
10.24425/bpasts.2023.144584
Keywords
few-shot learning
attention metric
CNN (convolutional neural network)
feature expression
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Authors and Affiliations
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Jianwei Wang
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2
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Deyun Chen
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College of Computer Science and Technology, Harbin University of Science and Technology, Harbin 150080, China
College of Computer Science and Technology, Heilongjiang Institute of Technology, Harbin 150050, China
1
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