Dynamic charge carrier transport behavior in the zirconium (Zr) oxide was investigated based on the frequency-dependent capacitance-voltage (C-V) and temperature-dependent current-voltage (I-V) measurements. The Zr oxide was formed on the ZIRLO and newly developed zirconium-based alloy (NDZ) by corrosion in the PWR-simulated loop at 360°C. The corrosion test for 90 days showed that the NDZ exhibits better corrosion resistance than ZIRLO alloy. Based on the C-V measurement, dielectric constant values for the Zr oxide was estimated to be 11.28 and 11.52 for the ZIRLO and NDZ. The capacitance difference between low and high frequency was larger in the ZIRLO than in the NDZ, which was attributed to more mobile electrical charge carriers in the oxide layer on the ZIRLO alloy. The current through the oxide layers on the ZIRLO increased more drastically with increasing temperature than on the NDZ, which indicating that more charge trap sites exist in the ZIRLO than in NDZ. Based on the dynamic charge carrier transport behavior, it was concluded that the electrical charge carrier transport within the oxide layers was closely related with the corrosion behavior of the Zr alloys.

In this study, the temperature influence on the spectral responsivity of a Light Emitting Diode (LED) used as a photoreceptor, combined to light source spectrum is correlated to electrical characteristics in order to propose an alternative method to estimate LED junction temperature, regardless of the absolute illumination intensity and based on the direct correlation between the integral of the product of two optical spectra and the photo-generated currents. A laboratory test bench for experimental optical measurements has been set in order to enable any characterizing of photoelectric devices in terms of spectral behaviour, in a wavelength range placed between 400–1000 nm, and of current-voltage characteristics as function of temperature by using two different illumination sources. The temperature is analysed in a range from 5°C up to 85°C, so as to evaluate thermal variation effects on the sensor performance. The photo-generated current of two LEDs with different peak wavelengths has been studied. Research has observed and mathematically analysed what follows: since the photo-generated current strictly depends on the combination between the spectral response of the photoreceptor and the lighting source response, it becomes possible to estimate indirectly the junction temperature of the LEDs by considering the ratio between the photogenerated currents obtained by using two different illumination sources. Such results may for one thing increase knowledge in the fields where LEDs are used as photo-detectors for many applications and for another, they could be extended to generic photodetectors, thus providing useful information in photovoltaic field, for instance.