The radar device for measurement of thickness and structure of "warm" glaciers was used in this work. The measurement of thickness of dielectric is based here on the examination of transit time of hight frequency electromagnetic pulse throught the measured stratum. A total ice volume of "warm" glaciers is in the melting temperature here. Such glaciers are characterized by a large number of internal structure defects. The electromagnetic wave reflections are caused not only b the glacier base but, additionally by ice crevasses, more imbided water layers and by all other defects of the internal glacier structure, too. The simple statistical method was elaborated for differentiation of essential layers reflections from random reglections caused by less extented objects. This method was used to obtain the two transversal profiles of the Hans Glacier (South Spitsbergen).