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Abstract

In the paper the problem of modelling thermal properties of semiconductor devices with the use of compact models is presented. This class of models is defined and their development over the past dozens of years is described. Possibilities of modelling thermal phenomena both in discrete semiconductor devices, monolithic integrated circuits, power modules and selected electronic circuits are presented. The problem of the usefulness range of compact thermal models in the analysis of electronic elements and circuits is discussed on the basis of investigations performed in Gdynia Maritime University.

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Authors and Affiliations

Krzysztof Górecki
Janusz Zarębski
Paweł Górecki
Przemysław Ptak
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Abstract

The paper presents a simple method of measuring the luminous flux value dedicated to LED light sources. This method uses information about a spatial radiation pattern of the lighting source under test and the results of illuminance measurements at the axis of this source. The method is described and the results of the measurements obtained using this method and the classical method are compared and discussed. Tests have been carried out for LED modules of different geometries. The measurement error of the considered method is analysed.
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Authors and Affiliations

Krzysztof Górecki
1
ORCID: ORCID
Aleksandra Kalinowska
2
Przemysław Ptak
1
ORCID: ORCID

  1. Department of Marine Electronics, Gdynia Maritime University, ul. Morska 81-87, 81-225 Gdynia, Poland
  2. Faculty of Electrical Engineering, Gdynia Maritime University, ul. Morska 81-87, 81-225 Gdynia, Poland

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