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Abstract

The article presents the method of magnetron sputtering for the deposition of conductive emitter coatings in semiconductor structures. The layers were applied to a silicon substrate. For optical investigations, borosilicate glasses were used. The obtained layers were subjected to both optical and electrical characterisation, as well as structural investigations. The layers on silicon substrates were tested with the four-point probe to find the dependence of resistivity on the layer thickness. The analysis of the elemental composition of the layer was conducted using a scanning electron microscope equipped with an EDS system. The morphology of the layers was examined with the atomic force microscope (AFM) of the scanning electron microscope (SEM) and the structures with the use of X-ray diffraction (XRD). The thickness of the manufactured layers was estimated by ellipsometry. The composition was controlled by selecting the target and the conditions of the application, i.e. the composition of the plasma atmosphere and the power of the magnetrons. Based on the obtained results, this article aims to investigate the influence of the manufacturing method and the selected process parameter on the optical properties of thin films, which should be characterised by the highest possible value of the transmission coefficient (>85–90%) and high electrical conductivity.
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Authors and Affiliations

Małgorzata Musztyfaga-Staszuk
1
Dušan Pudiš
2
Robert Socha
3
Katarzyna Gawlińska-Nęcek
4
Piotr Panek
4

  1. Silesian University of Technology, Welding Department, ul. Konarskiego 18A, 44-100 Gliwice, Poland
  2. Faculty of Faculty of Electrical Engineering and Information Technology, Department of Physics, Zilina, Slovakia
  3. Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences, ul. Niezapominajek 8, 30-239 Krakow, Poland
  4. Institute of Metallurgy and Materials Science PAS, ul. Reymonta 25, 30-059 Krakow, Poland
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Abstract

Drug-abuse detection tests are becoming increasingly commonplace in patient care today and provide a rapid and effective method for identifying illicit substances. Occasionally, they may yield a positive result, indicating the presence of a substance, even though the individual has not consumed the suspected drug what sometimes can significantly impact both medical and legal decisions. The study outlines the substances that can lead to false-positive drug test results for amphetamines, cannabinoids, and benzodiazepines. The study’s findings have revealed pivotal insights for patients receiving chronic treatment and their primary care physicians. Notably, amphetamine assays appear to be most prone to cross-reactivity with other substances. The beta-blocker group of medications, confirmed by various studies to interfere with amphetamine assays, could pose a substantial challenge in drug screening given its widespread use. Efavirenz also warrants mention, as it frequently triggers positive results for both benzodiazepine and cannabinoid assays among its users. This research helps highlight new areas for further investigation and aims to guide clinicians in their daily practice, especially when interpreting questionable positive drug-abuse test results. This comprehensive review serves as a valuable resource for clinicians to navigate false-positive scenarios effectively and maintain the highest standard of patient care.
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Authors and Affiliations

Kamil Możdżeń
1
Konrad Kaleta
1
Agnieszka Murawska
1
Jakub Pośpiech
1
ORCID: ORCID
Piotr Panek
1
Barbara Lorkowska-Zawicka
2
Beata Bujak-Giżycka
2

  1. Student Scientific Group of Clinical Pharmacology, Jagiellonian University Medical College, Kraków, Poland
  2. Depatment of Clinical Pharmacology, Jagiellonian University Medical College, Kraków, Poland

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