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  Wang, Jianwei (1)
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A few-shot fine-grained image recognition method

Jianwei Wang Deyun Chen

Bulletin of the Polish Academy of Sciences Technical Sciences | 2023 | 71 | 1 | e144584 | DOI: 10.24425/bpasts.2023.144584

Keywords few-shot learning attention metric CNN (convolutional neural network) feature expression

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Authors and Affiliations

Jianwei Wang

1 2

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ORCID:

Deyun Chen

1

College of Computer Science and Technology, Harbin University of Science and Technology, Harbin 150080, China
College of Computer Science and Technology, Heilongjiang Institute of Technology, Harbin 150050, China

1

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