Details Details PDF BIBTEX RIS Title Some quantum limits for scaling of electronic devices – estimations and measurements Journal title Metrology and Measurement Systems Yearbook 2012 Issue No 3 Authors Nawrocki, Waldemar ; Shukrinov, Yury M. Keywords nanostructure ; quantum effect ; integrated circuits. Divisions of PAS Nauki Techniczne Coverage 481-488 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2012 Type Artykuły / Articles Identifier DOI: 10.2478/v10178-012-0041-8 ; ISSN 2080-9050, e-ISSN 2300-1941 Source Metrology and Measurement Systems; 2012; No 3; 481-488 <div class="test"></div>