Details

Title

Quantization Error in Time-to-Digital Converters

Journal title

Metrology and Measurement Systems

Yearbook

2012

Issue

No 1

Authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2012

Identifier

DOI: 10.2478/v10178-012-0010-2 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2012; No 1

References

Waanenaker R. (2000), A theory of nonsubtractive dither, IEEE Transactions on Signal Processing, 48, 2, 499, doi.org/10.1109/78.823976 ; Krause L. (2006), Effective quantization by averaging and dithering, Measurement, 39, 681, doi.org/10.1016/j.measurement.2006.03.012 ; Widrow B. (2008), Quantization noise: roundoff error in digital computation, signal processing, control, and communications, doi.org/10.1017/CBO9780511754661 ; Alegria F. (2009), Study of the random noise test of analog-to-digital converters, Metrology and measurement systems, 16, 4, 545. ; Lal-Jadziak J. (2009), Variance of random signal mean square value digital estimator, Metrology and measurement systems, 16, 2, 267. ; Kalisz J. (2004), Review of methods for time interval measurements with picosecond resolution, Metrologia, 41, 17, doi.org/10.1088/0026-1394/41/1/004 ; Henzler S. (2010), Time-to-Digital Converters, doi.org/10.1007/978-90-481-8628-0 ; Fundamentals of Time Interval Measurement (1997). <i>Hewlett-Packard App. Note 200-3</i>. ; Baronti F. (2001), On the differential nonlinearity of time-to-digital converters based on delay-locked-loop delay lines, Nuclear Science, IEEE Transactions on, 48, 6, 2424, doi.org/10.1109/23.983253 ; Szymanowski R. (2006), Quantization error influence on measurement uncertainty of interpolation time counter, Measurement, Automation, Control, 9, 74. ; Zieliński M. (2008), Measurement system of oscillators' phase fluctuation and its applications, Electrical Review, 5, 84, 259. ; Chaberski D. (2009), The new method of calculation sum and difference histogram for quantized data, Measurement, 42, 1388, doi.org/10.1016/j.measurement.2009.05.004
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