TY - JOUR N2 - In situ monitoring of the thickness of thin diamond films during technological processes is important because it allows better control of deposition time and deeper understanding of deposition kinetics. One of the widely used techniques is laser reflectance interferometry (LRI) which enables non-contact measurement during CVD deposition. The authors have built a novel LRI system with a 405 nm laser diode which achieves better resolution compared to the systems based on He-Ne lasers, as reported so far. The system was used for in situ monitoring of thin, microcrystalline diamond films deposited on silicon substrate in PA-CVD processes. The thickness of each film was measured by stylus profilometry and spectral reflectance analysis as a reference. The system setup and interferometric signal processing are also presented for evaluating the system parameters, i.e. measurement uncertainty, resolution and the range of measurable film thickness. L1 - http://www.czasopisma.pan.pl/Content/90177/PDF/Journal10178-VolumeXX%20Issue4_02.pdf L2 - http://www.czasopisma.pan.pl/Content/90177 PY - 2013 IS - No 4 EP - 554 DO - 10.2478/mms-2013-0046 KW - interferometry KW - thin films KW - CVD KW - diamond KW - in situ measurements A1 - Kraszewski, Maciej A1 - Bogdanowicz, Robert PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation DA - 2013 T1 - Laser Reflectance Interferometry System with a 405 Nm Laser Diode for in Situ Measurements of CVD Diamond Thickness SP - 543 UR - http://www.czasopisma.pan.pl/dlibra/publication/edition/90177 T2 - Metrology and Measurement Systems ER -