TY - JOUR N2 - In the article we described the evolution of optical technology from lens-type microscopes working in far-field to SNOM (Scanning Near-Field Optical Microscopy) constructions. We considered two systems elaborated in our laboratory, namely PSTM system (Photon Scanning Tunelling Microscope) and SNOM system. In both systems we obtained subwavelength resolution. Some details about optical point probe technology in both systems are given and experimental results presented. L1 - http://www.czasopisma.pan.pl/Content/111687/PDF/(54-1)25.pdf L2 - http://www.czasopisma.pan.pl/Content/111687 PY - 2006 IS - No 1 EP - 32 KW - optical microscopy KW - PSTM KW - SNOM KW - tip technology KW - piezoresistive cantilever A1 - Radojewski, J. VL - vol. 54 DA - 2006 T1 - Moving from micro- to nanoworld in optical domain scanning probe microscopy SP - 25 UR - http://www.czasopisma.pan.pl/dlibra/publication/edition/111687 T2 - Bulletin of the Polish Academy of Sciences Technical Sciences ER -