@ARTICLE{Ghrib_M._Effect_2020, author={Ghrib, M. and Tlili, B. and Razeg, M. and Ouertani, R. and Gaidi, M. and Ezzaouia, H.}, volume={28}, number={3}, journal={Opto-Electronics Review}, pages={155-163}, howpublished={online}, year={2020}, publisher={Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology}, abstract={In this work, we present an extensive investigation of the effect of Al2O3 decoration on the morphological, structural and opto-electronic properties of a porous Si (Sip)/Cr2O3 composite. The Sip layers were prepared by the anodization method. Al2O3 and Cr2O3 thin films were deposited by physical vapour deposition. The morphological and micro-structural properties of Sip/Cr2O3/Al2O3 were studied using the scanning electron microscope, energy dispersive X-ray spectroscopy and X-ray diffraction techniques. It was found that Al2O3 decoration with different concentration strongly affects the Sip/Cr2O3 microstructure mainly at the level of porosity. Variable angle spectroscopic ellipsometry demonstrates a strong correlation between optical constants (n and k) of Sip/Cr2O3/Al2O3 and microstructure properties. Dielectric properties of Sip/Cr2O3/Al2O3 such as electrical conductivity and conduction mechanism were explored using impedance spectroscopy over the temperature interval ranging from 340 to 410°C. A semiconductor to the metallic transition has been observed at high frequency.}, type={Article}, title={Effect of Al2O3 decoration on the opto-electrical properties of a porous Si/Cr2O3 composite}, URL={http://www.czasopisma.pan.pl/Content/116801/PDF/OPELRE_28_2020_M_GHRIB.pdf}, doi={10.24425/opelre.2020.133673}, keywords={Cr2O3/Al2O3, porous Si, microstructure, optical and electrical properties}, }